GELAN, T. M. Convolutional Neural Networks for Defect Detection on LV cables. Journal of Applied Artificial Intelligence, [S. l.], v. 3, n. 2, p. 39–46, 2023. DOI: 10.48185/jaai.v3i2.620. Disponível em: https://www.sabapub.com/index.php/jaai/article/view/620. Acesso em: 30 oct. 2025.